3 results for “Built-In Self-Test (BIST)”

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Research ArticleOpen accessIn the keywordsLow Transition Test Pattern Generator Architecture for Built-in-Self-TestP. Sakthivel, A. NirmalKumar, T. MayilsamyProblem statement: In Built-In Self-Test (BIST), test patterns are generated and applied to the Circuit-Under-Test (CUT) by on-chip hardware; minimizing hardware overhead is a major concern of BIST implementation. In pseudorandom BIST architectures, the test patterns are generated in random nature by linear feedback shift registers. This normally requires more number of test patterns for testing the architectures which need … …American Journal of Applied Sciences, Vol. 9, Issue 9 · 21 Jul 2012 · 7,357 accessesView PDF Cite

Research ArticleOpen accessIn the keywordsLow Transition-Generalized Linear Feedback Shift Register Based Test Pattern Generator Architecture for Built-in-Self-TestP. Sakthivel, A. Nirmal KumarProblem statement: In Built-In Self-Test (BIST), test patterns are generated and applied to the Circuit-Under-Test (CUT) by on-chip hardware; minimizing hardware overhead is a major concern of BIST implementation. In pseudorandom BIST architectures, the test patterns are generated in random nature by Linear Feedback Shift Registers. This normally requires more number of test patterns for testing the architectures which need … …Journal of Computer Science, Vol. 8, Issue 6 · 13 Mar 2012 · 7,765 accessesView PDF Cite

Research ArticleOpen accessIn the abstractA Novel Method for Testing Digital to Analog Converter in Static RangeK. Hariharan, S. Gouthamraj, B. Subramaniam et al.Problem statement: Linearity testing methods for DAC usually involves usage of non-linear analog components, which are indeed prone to various errors. Few other testing methodologies involve complex circuitry for measuring exactitude of DAC. Practically, it is difficult to build those as Built In Self Test (BIST) due to complexity of calculation, which demands more usage of ALU (or core of … …American Journal of Applied Sciences, Vol. 7, Issue 8 · 31 Aug 2010 · 7,458 accessesView PDF Cite