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Author

K. Hariharan

Department of Electronics and Communication Engineering, Thiagarajar College of Engineering, Madurai, Tamil Nadu, India
1 article in our journals

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Research ArticleOpen accessA Novel Method for Testing Digital to Analog Converter in Static RangeK. Hariharan, S. Gouthamraj, B. Subramaniam et al.Problem statement: Linearity testing methods for DAC usually involves usage of non-linear analog components, which are indeed prone to various errors. Few other testing methodologies involve complex circuitry for measuring exactitude of DAC. Practically, it is difficult to build those as Built In Self Test (BIST) due to complexity of calculation, which demands more usage of ALU (or core of … …American Journal of Applied Sciences, Vol. 7, Issue 8 · 31 Aug 2010 · 7,458 accessesView PDFCite