Research ArticleOpen accessLow Transition Test Pattern Generator Architecture for Built-in-Self-TestP. Sakthivel, A. NirmalKumar, T. MayilsamyAmerican Journal of Applied Sciences, Vol. 9, Issue 9 · 21 Jul 2012 · 7,357 accessesView PDFCite
Author
6 articles in our journalsP. Sakthivel
Department of Electrical and Electronics Engineering, Velalar College of Engineering and Technology, Erode, Tamilnadu, IndiaArticles where this person is an author, newest first. People are matched by their name as printed (no ORCID iD is recorded for them), not by name alone; search the name as text to find namesakes too.
Research ArticleOpen accessAutomatic Specification Evaluator for Effective MigrationP. Sudhakar, P. SakthivelJournal of Computer Science, Vol. 8, Issue 6 · 14 Mar 2012 · 6,751 accessesView PDFCite
Research ArticleOpen accessReengineering Legacy to Modern System with One Time Checker for Information System EvolutionP. Sudhakar, P. SakthivelAmerican Journal of Applied Sciences, Vol. 9, Issue 6 · 14 Mar 2012 · 7,268 accessesView PDFCite
Research ArticleOpen accessLow Transition-Generalized Linear Feedback Shift Register Based Test Pattern Generator Architecture for Built-in-Self-TestP. Sakthivel, A. Nirmal KumarJournal of Computer Science, Vol. 8, Issue 6 · 13 Mar 2012 · 7,765 accessesView PDFCite
Research ArticleOpen accessOptimization of Test Scheduling and Test Access for ITC-02 SOC Benchmark CircuitsP. Sakthivel, R. Delhi Babu, P. NarayanasamyJournal of Computer Science, Vol. 5, Issue 4 · 30 Apr 2009 · 7,315 accessesView PDFCite
Research ArticleOpen accessANN Based Prediction of Effect of Reinforcements on Abrasive Wear Loss and Hardness in a Hybrid MMCP. Sathyabalan, V. Selladurai, P. SakthivelAmerican Journal of Engineering and Applied Sciences, Vol. 2, Issue 1 · 31 Mar 2009 · 7,551 accessesView PDFCite