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Author

A. Nirmal Kumar

1 article in our journals

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Research ArticleOpen accessLow Transition-Generalized Linear Feedback Shift Register Based Test Pattern Generator Architecture for Built-in-Self-TestP. Sakthivel, A. Nirmal KumarProblem statement: In Built-In Self-Test (BIST), test patterns are generated and applied to the Circuit-Under-Test (CUT) by on-chip hardware; minimizing hardware overhead is a major concern of BIST implementation. In pseudorandom BIST architectures, the test patterns are generated in random nature by Linear Feedback Shift Registers. This normally requires more number of test patterns for testing the architectures which need … …Journal of Computer Science, Vol. 8, Issue 6 · 13 Mar 2012 · 7,765 accessesView PDFCite