Author

P. Sakthivel

Department of Electrical and Electronics Engineering, Velalar College of Engineering and Technology, Erode, Tamilnadu, India

6 articles in our journals

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Research ArticleOpen accessLow Transition Test Pattern Generator Architecture for Built-in-Self-TestP. Sakthivel, A. NirmalKumar, T. MayilsamyProblem statement: In Built-In Self-Test (BIST), test patterns are generated and applied to the Circuit-Under-Test (CUT) by on-chip hardware; minimizing hardware overhead is a major concern of BIST implementation. In pseudorandom BIST architectures, the test patterns are generated in random nature by linear feedback shift registers. This normally requires more number of test patterns for testing the architectures which need … …American Journal of Applied Sciences, Vol. 9, Issue 9 · 21 Jul 2012 · 7,357 accessesView PDF Cite

Research ArticleOpen accessAutomatic Specification Evaluator for Effective MigrationP. Sudhakar, P. SakthivelProblem statement: Software Reengineering is an effective technique for reuse the older application in the new environment. Nowadays, Reengineering techniques are increasing in spite of many difficulties and issues arise when the older application is converted to newer one. So there is a need to enhance the new system to satisfy the user requirements and quality aspects. Approach: For this … …Journal of Computer Science, Vol. 8, Issue 6 · 14 Mar 2012 · 6,751 accessesView PDF Cite

Research ArticleOpen accessReengineering Legacy to Modern System with One Time Checker for Information System EvolutionP. Sudhakar, P. SakthivelProblem statement: The prime focus of Information System (IS) evolution process is the aggrandize productivity and quality of various components of the system. The evolution process is always challenging as it leads to an increase in overall complexity especially when the system changes are mostly confined to part of it. Approach: In this respect to improve efficiency and decrease complexity, … …American Journal of Applied Sciences, Vol. 9, Issue 6 · 14 Mar 2012 · 7,268 accessesView PDF Cite

Research ArticleOpen accessLow Transition-Generalized Linear Feedback Shift Register Based Test Pattern Generator Architecture for Built-in-Self-TestP. Sakthivel, A. Nirmal KumarProblem statement: In Built-In Self-Test (BIST), test patterns are generated and applied to the Circuit-Under-Test (CUT) by on-chip hardware; minimizing hardware overhead is a major concern of BIST implementation. In pseudorandom BIST architectures, the test patterns are generated in random nature by Linear Feedback Shift Registers. This normally requires more number of test patterns for testing the architectures which need … …Journal of Computer Science, Vol. 8, Issue 6 · 13 Mar 2012 · 7,765 accessesView PDF Cite

Research ArticleOpen accessOptimization of Test Scheduling and Test Access for ITC-02 SOC Benchmark CircuitsP. Sakthivel, R. Delhi Babu, P. NarayanasamyProblem statement: This study presented the optimized test scheduling and test access for ITC-02 SOC benchmark circuits using genetic algorithm. In the scheduling procedure of SOC, scheduling problem was formulated as a sequence of two problems and solved. Approach: Test access mechanism width was partitioned into two and three partitions and the applications of test vectors and test vector assignments … …Journal of Computer Science, Vol. 5, Issue 4 · 30 Apr 2009 · 7,315 accessesView PDF Cite

Research ArticleOpen accessANN Based Prediction of Effect of Reinforcements on Abrasive Wear Loss and Hardness in a Hybrid MMCP. Sathyabalan, V. Selladurai, P. SakthivelProblem statement: The reinforcements added to an alloy lead to variation in properties. The content and size of the reinforcement influences the properties of composites. Very little research has been carried out in hybrid composites. Work on hybrid LM6 aluminium alloy metal matrix composites (MMC) with flyash and SiC has been initiated here. The effect of the four parameters, size … …American Journal of Engineering and Applied Sciences, Vol. 2, Issue 1 · 31 Mar 2009 · 7,551 accessesView PDF Cite