Sign inSubmit
Tips: “quotes” for a phrase · author:Lee · a DOI goes straight to its article

36 articles for “Test Bench”
Set a search alert
Research ArticleOpen accessPhrase in the titleDesign and Experiment on Rotary Cutting Test Bench for Sweet Potato VineGuizhi Mu, Zhengduo Liu, Junming Liu et al.In order to study the cutting mechanism of sweet potato vine, provide technical support and theoretical basis for the development of sweet potato vine harvesting machinery and improve the resource utilization rate of sweet potato vine, a cutting test bench for sweet potato vine was designed. The test bench consists of two parts: Mechanical part and measurement-control part. In this … …American Journal of Biochemistry and Biotechnology, Vol. 18, Issue 1 · 21 Mar 2022 · 5,836 accessesView PDFCite
Research ArticleOpen accessPhrase in the titleLow Cost Test Bench to Assess Energy Efficiency of Communications Network EquipmentLuiz Henrique Biazotto, Alexandre de Assis Mota, Lia Toledo Moreira MotaCommunication network Quality of Service (QoS) degradation can lead to the consumption of additional energy to exchange information than that needed in normal conditions. If such behavior is known, network management can be more efficient and accurate, permitting to control more efficiently the energy consumption in telecommunication equipments. This study describes a test bench that can simultaneously measure the QoS … …Journal of Computer Science, Vol. 8, Issue 11 · 20 Sep 2012 · 6,678 accessesView PDFCite
Research ArticleOpen accessEvery word in the titleOptimization of Test Scheduling and Test Access for ITC-02 SOC Benchmark CircuitsP. Sakthivel, R. Delhi Babu, P. NarayanasamyProblem statement: This study presented the optimized test scheduling and test access for ITC-02 SOC benchmark circuits using genetic algorithm. In the scheduling procedure of SOC, scheduling problem was formulated as a sequence of two problems and solved. Approach: Test access mechanism width was partitioned into two and three partitions and the applications of test vectors and test vector assignments … …Journal of Computer Science, Vol. 5, Issue 4 · 30 Apr 2009 · 7,315 accessesView PDFCite
Research ArticleOpen accessEvery word in the titleThe Traveling Salesman Problem as a Benchmark Test for a Social-Based Genetic AlgorithmN. A. AL-Madi, A. T. KhaderPresent research, showed Traveling Salesman Problem (TSP) to compare values and results concerning the averages and best fits of both, Simple Standard Genetic Algorithm (SGA) and a new approach of Genetic Algorithms named Social-Based Genetic Algorithm (SBGA). Results from TSP test on Social-Based Genetic Algorithms (SBGA) were presented. Results were encouraging in Social-Based Genetic Algorithms (SBGA) performs better in finding … …Journal of Computer Science, Vol. 4, Issue 10 · 31 Oct 2008 · 6,843 accessesView PDFCite
Research ArticleOpen accessIn the keywordsStudy of Properties of a Dispersant Used for Extracting Oil with High Gas-Oil RatioVladimir Verbitsky, Aleksey Dengaev, Oleg Zubkov, Dmitry KoshkinThe article presents the bench test results for a dispersant manufactured by Izhnefteplast Company, which specializes in batch production of unique submersible pumping equipment for oil extraction. The submersible equipment is unique in that the working elements of the pumping equipment are made of polymeric materials unlike the conventional concept of pumping machinery for oil production. The relevance of the … …American Journal of Applied Sciences, Vol. 13, Issue 2 · 24 Feb 2016 · 7,293 accessesView PDFCite
Research ArticleOpen accessIn the abstractReinforcing Effect of Strain Gauges on 3D Printed Polymers: An Experimental InvestigationSalvatore Brischetto, Roberto TorreStrain gauges are ordinary transducers for strain measuring; their operation relies on the electrical resistance, which varies as the underlying substrate is subjected to mechanical deformation. The mechanical strain can be obtained by converting the electrical signal through a gauge factor, provided by the manufacturer. It was demonstrated that its values are not unique; it may be influenced by the … …American Journal of Engineering and Applied Sciences, Vol. 14, Issue 1 · 9 Jan 2021 · 7,658 accessesView PDFCite
Research ArticleOpen accessIn the abstractUzNER: A Human-Reviewed Benchmark for Uzbek Named Entity Recognition With Gazetteer-Augmented Transformer ModelsBobur Saidov, Vladimir Barakhnin et al.UzNER-100K is a large-scale human-reviewed benchmark for Uzbek named entity recognition with 100,000 training sentences, 18 fine-grained entity types and 200,083 entity mentions across 114,269 sentences in total. The corpus was constructed through an LLM-assisted, expert-reviewed annotation pipeline that achieved strong reliability on the main audit subset while substantially reducing corpus-construction effort. The benchmark includes a standard test split, a … …Journal of Computer Science, Vol. 22, Issue 6 · 22 Jun 2026 · 1,308 accessesView PDFCite
Research ArticleOpen accessIn the abstractWeb-Enabled Generalized Architectural Model for Online Power System AnalysisBoopathi C. Sengodan, Subhransu Sekhar Dash, Subramani Chinnamuthu et al.In this study, an effective Web-enabled generalized architectural model is proposed. The proposed model makes the power system analysis to be completely secured, distributed, platform-independent and language-independent. Although significant progress has been made for on-line power system analysis in distributed environment, still efficient distributed environment has not yet been exploited. The Web-enabled architectural models are emerging as basic methodologies to … …American Journal of Applied Sciences, Vol. 10, Issue 9 · 24 Aug 2013 · 6,717 accessesView PDFCite
Research ArticleOpen accessIn the abstractLow Transition Test Pattern Generator Architecture for Built-in-Self-TestP. Sakthivel, A. NirmalKumar, T. MayilsamyProblem statement: In Built-In Self-Test (BIST), test patterns are generated and applied to the Circuit-Under-Test (CUT) by on-chip hardware; minimizing hardware overhead is a major concern of BIST implementation. In pseudorandom BIST architectures, the test patterns are generated in random nature by linear feedback shift registers. This normally requires more number of test patterns for testing the architectures which need … …American Journal of Applied Sciences, Vol. 9, Issue 9 · 21 Jul 2012 · 7,357 accessesView PDFCite
Research ArticleOpen accessIn the abstractLow Transition-Generalized Linear Feedback Shift Register Based Test Pattern Generator Architecture for Built-in-Self-TestP. Sakthivel, A. Nirmal KumarProblem statement: In Built-In Self-Test (BIST), test patterns are generated and applied to the Circuit-Under-Test (CUT) by on-chip hardware; minimizing hardware overhead is a major concern of BIST implementation. In pseudorandom BIST architectures, the test patterns are generated in random nature by Linear Feedback Shift Registers. This normally requires more number of test patterns for testing the architectures which need … …Journal of Computer Science, Vol. 8, Issue 6 · 13 Mar 2012 · 7,765 accessesView PDFCite