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Research ArticleOpen accessPhrase in the titleOptimal Pareto Solutions of a Dynamic C Chart: An Application of Statistical Process Control on a Semiconductor Devices Manufacturing ProcessToni Lupo, Filippo SgroiThe present paper proposes a novel economic-statistical design procedure of a dynamic c control chart for the Statistical Process Control (SPC) of the manufacturing process of semiconductor devices. Particularly, a non-linear constrained mathematical programming model is formulated and solved by means of the ϵ-constraint method. A numerical application is developed in order to describe the Pareto frontier, that is the … …American Journal of Applied Sciences, Vol. 12, Issue 4 · 28 May 2015 · 6,473 accessesView PDF Cite

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