Optimal Pareto Solutions of a Dynamic C Chart: An Application of Statistical Process Control on a Semiconductor Devices Manufacturing Process
Toni Lupo1 & Filippo Sgroi2 Show affiliations
- Dipartimento di Ingegneria Chimica, Gestionale, Informatica, Meccanica (DICGIM), Italy
- Department of Agricultural and Forest Sciences, Università degli Studi di Palermo, 90128 Palermo, Italy
American Journal of Applied Sciences, Volume 12, Issue 4, pp. 254–261 · doi.org/10.3844/ajassp.2015.254.261
Abstract
The present paper proposes a novel economic-statistical design procedure of a dynamic c control chart for the Statistical Process Control (SPC) of the manufacturing process of semiconductor devices. Particularly, a non-linear constrained mathematical programming model is formulated and solved by means of the ϵ-constraint method. A numerical application is developed in order to describe the Pareto frontier, that is the set of optimal c charts and the related practical considerations are given. The obtained results highlight how the performance of the developed dynamic c chart overcome that of the related static one, thus demonstrating the effectiveness of the proposed procedure.
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Lupo, T. & Sgroi, F. (2015). Optimal Pareto Solutions of a Dynamic C Chart: An Application of Statistical Process Control on a Semiconductor Devices Manufacturing Process. American Journal of Applied Sciences, 12(4), 254–261. https://doi.org/10.3844/ajassp.2015.254.261
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