Research ArticleOpen accessEvery word in the titleLossless Compression Using LFSRsR. Muthiah, K. Neelakantan, Somi SebastianWhile lossy compression techniques are used for images, sound. where feature reproduction is more important than the actual data, it is necessary to use lossless compression for certain files containing data, programmes. Lossless compression techniques are not as effective as lossy ones and usually require a lot of computation for both compression and decompression. We presented a novel lossless compression … …Journal of Computer Science, Vol. 3, Issue 1 · 31 Jan 2007 · 6,999 accessesView PDFCite
Research ArticleOpen accessIn the keywordsDesign of a LOW Cost IC TesterLiakot Ali, Roslina Sidek, Ishak Aris et al.Low cost Integrated Circuit (IC) testing is now a burning issue in semiconductor technology. Conventional IC tester, Automatic Test Equipment (ATE), cannot cope with the today’s continuously increasing complexities in IC technology. Deterministic algorithm, which is an idea of 1960’s, is adopted in the ATE. Recently pseudo-random testing approach of IC testing has been emerged as an economically viable alternative … …American Journal of Applied Sciences, Vol. 2, Issue 4 · 30 Apr 2005 · 7,063 accessesView PDFCite
Research ArticleOpen accessIn the keywordsLow Transition Test Pattern Generator Architecture for Built-in-Self-TestP. Sakthivel, A. NirmalKumar, T. MayilsamyProblem statement: In Built-In Self-Test (BIST), test patterns are generated and applied to the Circuit-Under-Test (CUT) by on-chip hardware; minimizing hardware overhead is a major concern of BIST implementation. In pseudorandom BIST architectures, the test patterns are generated in random nature by linear feedback shift registers. This normally requires more number of test patterns for testing the architectures which need … …American Journal of Applied Sciences, Vol. 9, Issue 9 · 21 Jul 2012 · 7,357 accessesView PDFCite