6 results for “K. NeelaKantan”

Research ArticleOpen accessIn the author namesOR-Bridging Fault Identification and Diagnosis for Exclusive-OR Sum of Products Reed-Muller Canonical CircuitsV. Geetha, N. Devarajan, P. N. NeelakantanProblem statement: The faults in digital circuit can be classified broadly as single stuck-atfaults, multiple stuck-ay-faults, stuck-open faults, stuck-on faults, path delay faults, transient faults. Extensive research had been carried out in the field of testing of digital circuits to limit the number of input vectors. The cardinality of the test vectors proposed by many authors was quite high for … …Journal of Computer Science, Vol. 7, Issue 5 · 7 May 2011 · 7,156 accessesView PDF Cite

Research ArticleOpen accessIn the author namesImage Compression and Reconstruction using Cubic Spline Interpolation TechniqueR. Muthaiah, K. NeelaKantan, Vidur Sharma, Amit AroraA new dimension of image compression using random pixels of irregular sampling and image reconstruction using cubic-spline interpolation techniques proposed in this paper. It also covers the wide field of multimedia communication concerned with multimedia messaging (MMS) and image transfer through mobile phones and tried to find a mechanism to transfer images with minimum bandwidth requirement. This method would provide … …American Journal of Applied Sciences, Vol. 5, Issue 11 · 30 Nov 2008 · 7,200 accessesView PDF Cite

Research ArticleOpen accessIn the author namesLossless Compression Using LFSRsR. Muthiah, K. Neelakantan, Somi SebastianWhile lossy compression techniques are used for images, sound. where feature reproduction is more important than the actual data, it is necessary to use lossless compression for certain files containing data, programmes. Lossless compression techniques are not as effective as lossy ones and usually require a lot of computation for both compression and decompression. We presented a novel lossless compression … …Journal of Computer Science, Vol. 3, Issue 1 · 31 Jan 2007 · 7,004 accessesView PDF Cite

Research ArticleOpen accessIn the author namesSingle Stuck-At Fault Diagnosing Circuit of Reed-Muller Canonical Exclusive-Or Sum of Product Boolean ExpressionsP. N. Neelakantan, A. E. JeyakumarA testable design with a universal test set for single stuck-at zero and stuck-at one faults of Reed-Muller canonical form of Exclusive-OR sum of product logic expressions is proposed. The test circuit detects almost all the single stuck-at faults and needs only simple modifications for variations in the circuit under test. The number of test vectors is also quite small … …Journal of Computer Science, Vol. 2, Issue 7 · 31 Jul 2006 · 6,593 accessesView PDF Cite