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Research ArticleOpen accessOR-Bridging Fault Identification and Diagnosis for Exclusive-OR Sum of Products Reed-Muller Canonical CircuitsV. Geetha, N. Devarajan, P. N. NeelakantanProblem statement: The faults in digital circuit can be classified broadly as single stuck-atfaults, multiple stuck-ay-faults, stuck-open faults, stuck-on faults, path delay faults, transient faults. Extensive research had been carried out in the field of testing of digital circuits to limit the number of input vectors. The cardinality of the test vectors proposed by many authors was quite high for … …Journal of Computer Science, Vol. 7, Issue 5 · 7 May 2011 · 7,151 accessesView PDF Cite