Research ArticleOpen accessPhrase in the titleDesign of a Current Sensor for IDDQ Testing of CMOS ICMohd Liakot Ali, Nurul Huda KhamisThis study presents the design of an off-chip current sensor for IDDQ testing of CMOS (Complementary Metal-oxide Semiconductor) ICs (integrated circuit). It provides a linear voltage signal of IDDQ current with a conversion factor of 5 mV/μA without any amplification. A voltage-controlled switch is used to bypass the transient current peaks. It has also been shown that the sensor is … …American Journal of Applied Sciences, Vol. 2, Issue 3 · 31 Mar 2005 · 6,834 accessesView PDFCite