4 articles for “Design for Test (DFT)”

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Research ArticleOpen accessIn the keywordsDesign For Test Technique for Leakage Power Reduction in Nanoscale Static Random Access MemoryN. M. Sivamangai, GunavathiProblem statement: As technology scales down, the integration density of transistors increases and most of the power is dissipated as leakage. Leakage power reduction is achieved in Static Random Access Memory (SRAM) cells by increasing the source voltage (source biasing) of the SRAM array. Another promising issue in nanoscaled devices is the process parameter variations. Due to these variations, higher … …Journal of Computer Science, Vol. 7, Issue 8 · 15 Jul 2011 · 6,505 accessesView PDF Cite

Research ArticleOpen accessIn the keywordsLow Transition Test Pattern Generator Architecture for Built-in-Self-TestP. Sakthivel, A. NirmalKumar, T. MayilsamyProblem statement: In Built-In Self-Test (BIST), test patterns are generated and applied to the Circuit-Under-Test (CUT) by on-chip hardware; minimizing hardware overhead is a major concern of BIST implementation. In pseudorandom BIST architectures, the test patterns are generated in random nature by linear feedback shift registers. This normally requires more number of test patterns for testing the architectures which need … …American Journal of Applied Sciences, Vol. 9, Issue 9 · 21 Jul 2012 · 7,357 accessesView PDF Cite

Research ArticleOpen accessIn the keywordsLow Transition-Generalized Linear Feedback Shift Register Based Test Pattern Generator Architecture for Built-in-Self-TestP. Sakthivel, A. Nirmal KumarProblem statement: In Built-In Self-Test (BIST), test patterns are generated and applied to the Circuit-Under-Test (CUT) by on-chip hardware; minimizing hardware overhead is a major concern of BIST implementation. In pseudorandom BIST architectures, the test patterns are generated in random nature by Linear Feedback Shift Registers. This normally requires more number of test patterns for testing the architectures which need … …Journal of Computer Science, Vol. 8, Issue 6 · 13 Mar 2012 · 7,765 accessesView PDF Cite

Research ArticleOpen accessIn the abstractInverse Discrete Fourier Transform-Discrete Fourier Transform Techniques for Generating and Receiving Spectrally Efficient Frequency Division Multiplexing SignalsSahmed IdarwazehProblem statement: Spectrally Efficient Frequency Division Multiplexing (SEFDM) system promises bandwidth savings by multiplexing overlapped non-orthogonal sub-carriers. However, the loss of orthogonality results in increasing the complexity of generation and detection of the signal. In this work, we propose simple framework for the generation of the SEFDM signal based on the Inverse Discrete Fourier Transform (IDFT). Approach: This study further … …American Journal of Engineering and Applied Sciences, Vol. 4, Issue 4 · 31 Jul 2012 · 8,310 accessesView PDF Cite