3 articles for “Circuit-Under-Test (CUT)”

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Research ArticleOpen accessIn the keywordsLow Transition Test Pattern Generator Architecture for Built-in-Self-TestP. Sakthivel, A. NirmalKumar, T. MayilsamyProblem statement: In Built-In Self-Test (BIST), test patterns are generated and applied to the Circuit-Under-Test (CUT) by on-chip hardware; minimizing hardware overhead is a major concern of BIST implementation. In pseudorandom BIST architectures, the test patterns are generated in random nature by linear feedback shift registers. This normally requires more number of test patterns for testing the architectures which need … …American Journal of Applied Sciences, Vol. 9, Issue 9 · 21 Jul 2012 · 7,357 accessesView PDF Cite

Research ArticleOpen accessIn the keywordsLow Transition-Generalized Linear Feedback Shift Register Based Test Pattern Generator Architecture for Built-in-Self-TestP. Sakthivel, A. Nirmal KumarProblem statement: In Built-In Self-Test (BIST), test patterns are generated and applied to the Circuit-Under-Test (CUT) by on-chip hardware; minimizing hardware overhead is a major concern of BIST implementation. In pseudorandom BIST architectures, the test patterns are generated in random nature by Linear Feedback Shift Registers. This normally requires more number of test patterns for testing the architectures which need … …Journal of Computer Science, Vol. 8, Issue 6 · 13 Mar 2012 · 7,765 accessesView PDF Cite

Research ArticleOpen accessIn the keywordsFault Detection and Classification in Power Electronic Circuits Using Wavelet Transform and Neural NetworkVenugopal Prasannamoorthy, Nanjundappan DevarajanProblem statement: The identification of faults in any analog circuit is highly required to ensure the reliability of the circuit. Early detection of faults in a circuit can greatly assist in maintenance of the system by avoiding possibly harmful damage borne out of the fault. Approach: A novel method for establishing a fault dictionary using Wavelet transform is presented. The … …Journal of Computer Science, Vol. 7, Issue 1 · 15 Jan 2011 · 8,415 accessesView PDF Cite