2 results for “Bridging Faults”

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Research ArticleOpen accessIn the keywordsFAULT AND RELIABILITY ANALYSIS OF CARBON NANO TUBE FET SRAM IN THE PRESENCE OF SINGLE EVENT UPSETT. R. Rajalakshmi, R. SudhakarCarbon nano tube devices are considered as a better replacement for CMOS technology nowadays due to its decreased sizing and increased performance. Resistive open and bridging faults play vital role in the dynamic fault analysis. These faults are important since the number of interconnects have increased. In this study we discuss the effect of open and bridging defects along with … …American Journal of Applied Sciences, Vol. 11, Issue 8 · 28 May 2014 · 6,653 accessesView PDF Cite

Research ArticleOpen accessIn the abstractOR-Bridging Fault Identification and Diagnosis for Exclusive-OR Sum of Products Reed-Muller Canonical CircuitsV. Geetha, N. Devarajan, P. N. NeelakantanProblem statement: The faults in digital circuit can be classified broadly as single stuck-atfaults, multiple stuck-ay-faults, stuck-open faults, stuck-on faults, path delay faults, transient faults. Extensive research had been carried out in the field of testing of digital circuits to limit the number of input vectors. The cardinality of the test vectors proposed by many authors was quite high for … …Journal of Computer Science, Vol. 7, Issue 5 · 7 May 2011 · 7,151 accessesView PDF Cite