Research ArticleOpen accessIn the keywordsLow Transition Test Pattern Generator Architecture for Built-in-Self-TestP. Sakthivel, A. NirmalKumar, T. MayilsamyProblem statement: In Built-In Self-Test (BIST), test patterns are generated and applied to the Circuit-Under-Test (CUT) by on-chip hardware; minimizing hardware overhead is a major concern of BIST implementation. In pseudorandom BIST architectures, the test patterns are generated in random nature by linear feedback shift registers. This normally requires more number of test patterns for testing the architectures which need … …American Journal of Applied Sciences, Vol. 9, Issue 9 · 21 Jul 2012 · 7,357 accessesView PDFCite
Research ArticleOpen accessAll words, across the recordLossless Compression Using LFSRsR. Muthiah, K. Neelakantan, Somi SebastianWhile lossy compression techniques are used for images, sound. where feature reproduction is more important than the actual data, it is necessary to use lossless compression for certain files containing data, programmes. Lossless compression techniques are not as effective as lossy ones and usually require a lot of computation for both compression and decompression. We presented a novel lossless compression … …Journal of Computer Science, Vol. 3, Issue 1 · 31 Jan 2007 · 6,999 accessesView PDFCite