
American Journal of Applied Sciences
ISSN 1546-9239 (print)eISSN 1554-3641 (online) Open access
Research Article · Open access · Published 24 July 2013
Seismic Refraction Method: A Technique for Determining the Thickness of Stratified Substratum
Ochuko AnomohanranSince publication
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12Citations (Crossref)
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Citing articles (12)
Read from Crossref’s cited-by service every week, newest first.
- doi:10.1007/s10346-025-02615-7Found 11 February 2026
- doi:10.1002/nsg.12330Found 12 January 2025
- doi:10.1016/j.pce.2024.103845Found 28 December 2024
- doi:10.1190/geo2022-0405.1Found 25 February 2023
- doi:10.1007/s12517-022-11162-7Found 7 January 2023
- doi:10.1007/978-981-19-6513-5_18Found 2 December 2022
- doi:10.1007/978-3-030-60706-7_48Found 24 December 2020
- doi:10.1007/s10346-020-01526-zFound 22 September 2020
- doi:10.1088/1742-6596/995/1/012082Found 12 June 2020
- doi:10.1088/1755-1315/221/1/012062Found 12 June 2020
- doi:10.1088/1755-1315/244/1/012033Found 12 June 2020
- doi:10.1007/s12517-019-4397-xFound 12 June 2020