Seismic Refraction Method: A Technique for Determining the Thickness of Stratified Substratum
Ochuko Anomohanran1 Show affiliations
- Department of Physics, Faculty of Science, Delta State University, Abraka, Delta State, Nigeria
American Journal of Applied Sciences, Volume 10, Issue 8, pp. 857–862 · doi.org/10.3844/ajassp.2013.857.862
Abstract
The seismic refraction survey is a very important geophysical technique used in the investigation of subsurface characteristics. This is why this study was carried out to emphasize the ability of the seismic refraction method in determining the thickness of stratified layers of soil and rock. The results obtained are generalized expressions that relate travel time, offset distance, velocity and thickness of subsurface layers.
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Anomohanran, O. (2013). Seismic Refraction Method: A Technique for Determining the Thickness of Stratified Substratum. American Journal of Applied Sciences, 10(8), 857–862. https://doi.org/10.3844/ajassp.2013.857.862
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