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American Journal of Applied Sciences

ISSN 1546-9239 (print)eISSN 1554-3641 (online) Open access
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Research Article · Open access · Published 27 October 2011

Applying Fuzzy Analytic Hierarchy Process and Grey Relation Analysis to Evaluate the Supply Chain Performance of the Wafer Testing House

Yun-Chin Chen, Jun-Yuan Kuo, Bang-Ting Luo
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Citing articles (2)

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  1. doi:10.1108/imds-05-2021-0270Found 1 September 2021
  2. doi:10.1080/00207543.2012.756592Found 12 June 2020