Applying Fuzzy Analytic Hierarchy Process and Grey Relation Analysis to Evaluate the Supply Chain Performance of the Wafer Testing House
Yun-Chin Chen1, Jun-Yuan Kuo2 & Bang-Ting Luo3 Show affiliations
- Department of Business Administration, De Lin Institute of Technology, No.1, Ln. 380, Qingyun Rd., Tucheng Dist, New Taipei City 236, (ROC), Taiwan
- Department of International Business, Kainan University, Taiwan
- Department of International Business, Kainan University, No.1 Kainan Road, Luzhu Shiang, Taoyuan 338, (R.O.C), Taiwan
American Journal of Applied Sciences, Volume 8, Issue 12, pp. 1398–1403 · doi.org/10.3844/ajassp.2011.1398.1403
Abstract
Problem statement: In the information age, the process of E-Commerce (EC) operates quickly and the present enterprises of Taiwan have to face the Free Cross-Strait Market (FCSM) with Mainland China, which will definitely change the model as well as the performance of the supply chain. Hence, this study focuses on the issue of supply chain performance evaluation of the wafer testing house in Taiwan. Approach: This investigation applied the Fuzzy Analytic Hierarchy Process (FAHP) to derive the weights of influential indicators for evaluating the supply chain performance of the wafer testing house and the Grey Relation Analysis (GRA) was used to evaluate the performance between the FCSM and EC aspects. Results: The analyzed results had identified the indicator weight of the supply chain performance evaluation in the wafer testing house and the indicator performances between different aspects were compared. The research results indicated that the FCSM aspect had better performance than EC aspect of the supply chain evaluation in the wafer testing house. Conclusion/Recommendations: Based on the analyzed results, the managers can find out the problems and improve the supply chain performance of the wafer testing house. This study not only can be a good basis for improvements of the case company, but also can be the reference for evaluating the supply chain performance of the wafer testing house.
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Chen, Y., Kuo, J. & Luo, B. (2011). Applying Fuzzy Analytic Hierarchy Process and Grey Relation Analysis to Evaluate the Supply Chain Performance of the Wafer Testing House. American Journal of Applied Sciences, 8(12), 1398–1403. https://doi.org/10.3844/ajassp.2011.1398.1403
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