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American Journal of Applied Sciences

ISSN 1546-9239 (print)eISSN 1554-3641 (online) Open access
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Research Article · Open access · Published 30 April 2007

Deep Defects Annihilation in GaAs1-xNx Layers by Si-doping

N. Ben Sedrine, A. Hamdouni, J. Rihani et al.
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Citing articles (6)

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  1. doi:10.1016/j.ijleo.2016.05.057Found 12 June 2020
  2. doi:10.1016/j.spmi.2012.01.013Found 12 June 2020
  3. doi:10.1016/j.ssc.2020.113913Found 12 June 2020
  4. doi:10.1016/j.physe.2010.04.012Found 12 June 2020
  5. doi:10.1109/ictonmw.2007.4446966Found 12 June 2020
  6. doi:10.1016/j.spmi.2014.04.004Found 12 June 2020