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American Journal of Applied Sciences

ISSN 1546-9239 (print)eISSN 1554-3641 (online) Open access
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Research Article · Open access · Published 31 March 2005

Design of a Current Sensor for IDDQ Testing of CMOS IC

Mohd Liakot Ali, Nurul Huda Khamis
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Citing articles (4)

Read from Crossref’s cited-by service every week, newest first.

  1. doi:10.3844/ajassp.2010.1353.1357Found 12 June 2020
  2. doi:10.3844/ajassp.2010.1254.1263Found 12 June 2020
  3. doi:10.1109/icmel.2008.4559307Found 12 June 2020
  4. doi:10.1007/978-981-10-8234-4_4Found 12 June 2020