Research ArticleOpen accessAll words, across the recordApplying Fuzzy Analytic Hierarchy Process and Grey Relation Analysis to Evaluate the Supply Chain Performance of the Wafer Testing HouseYun-Chin Chen, Jun-Yuan Kuo, Bang-Ting LuoAmerican Journal of Applied Sciences, Vol. 8, Issue 12 · 27 Oct 2011 · 6,377 accessesView PDFCite