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Research ArticleOpen accessPhrase in the titleFAULT AND RELIABILITY ANALYSIS OF CARBON NANO TUBE FET SRAM IN THE PRESENCE OF SINGLE EVENT UPSETT. R. Rajalakshmi, R. SudhakarCarbon nano tube devices are considered as a better replacement for CMOS technology nowadays due to its decreased sizing and increased performance. Resistive open and bridging faults play vital role in the dynamic fault analysis. These faults are important since the number of interconnects have increased. In this study we discuss the effect of open and bridging defects along with … …American Journal of Applied Sciences, Vol. 11, Issue 8 · 28 May 2014 · 6,653 accessesView PDF Cite

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