2 results for “Ellipsometry”

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Research ArticleOpen accessEvery word in the titleThermo Optical Properties and Related Electronic Polarizabilities of MoO3 Thin Films Using EllipsometryZahid HussainThermo optical properties are reported for thermally evaporated MoO3 thin films using ellipsometry. The values of TOCs: dn/dT and dk/dT relating to MoO3 thin films are found to be negative and positive, respectively over the temperature range 295-460 K and also are found to have the same trend over the range 120-300 K, and have values of the order of … …American Journal of Engineering and Applied Sciences, Vol. 12, Issue 1 · 1 Apr 2019 · 7,571 accessesView PDF Cite

Research ArticleOpen accessIn the abstractDetermination of Absorption Coefficients and Thermal Diffusivity of Modulated Doped GaAlAs/GaAs Heterostructure by Photothermal Deflection SpectroscopyS. Aloulou, M. Fathallah, M. Oueslati, A. SfaxiWe report in this study theoretical and experimental studies of photothermal deflection spectroscopy (PDS) for planar doped heterostructures AlGaAs/GaAs. The PDS spectra at T=300K are recorded by varying the wavelength of the excited radiation for different modulation frequencies. They show two different regions related to the fundamental electronic transitions from GaAs and Si doped AlGaAs. The DX levels have been … …American Journal of Applied Sciences, Vol. 2, Issue 10 · 31 Oct 2005 · 7,262 accessesView PDF Cite