24 results for “integrated circuits”

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Research ArticleOpen accessIn the abstractControl Strategy for Discontinuous Conduction Mode Boost Rectifier with Low Total Harmonic Distortion and Improved Dynamic ResponseH.S. AthabDue to its simplicity, the discontinuous conduction mode boost rectifier is potentially the least expensive active line-harmonics reducing circuit. Problem statement: The line current however, shows considerable distortion when the peak input voltage is close to the output voltage, As a result, the input power factor is poor. This study proposes a simple, low-cost method to reduce the line harmonics. … …American Journal of Engineering and Applied Sciences, Vol. 1, Issue 4 · 31 Dec 2008 · 7,418 accessesView PDF Cite

Research ArticleOpen accessIn the abstractStudy of Network on Chip resources allocation for QoS ManagementAbdelhamid HELALI, Adel SOUDANI, Jamila BHAR, Salem NASRIThe increasing complexity of integrated circuits and application requirements drive the research of new on-chip interconnection architectures. A network on chip draws on concepts inherited from distributed systems and computer networks subject areas to interconnect IP cores in a structured and scalable way. The main goal pursued is to achieve superior bandwidth when compared to conventional on-chip bus architectures. The … …Journal of Computer Science, Vol. 2, Issue 10 · 31 Oct 2006 · 6,307 accessesView PDF Cite

Research ArticleOpen accessIn the abstractSingle-Electron Transistor (SET) Process and Device Simulation Using SYSNOPSYS TCAD ToolsUda Hashim, Amiza RasmiSimulation of semiconductor device fabrication and operation is important to the design and manufacture of integrated circuits because it provides insights into complex phenomena that cannot obtained through experimentation or simple analytic models. Process and device simulation is commonly using for the design of new very large scale integration (VLSI) devices and processes. Simulation programs serves as exploratory tools in … …American Journal of Applied Sciences, Vol. 3, Issue 7 · 31 Jul 2006 · 7,418 accessesView PDF Cite

Research ArticleOpen accessIn the abstractDesign of a LOW Cost IC TesterLiakot Ali, Roslina Sidek, Ishak Aris et al.Low cost Integrated Circuit (IC) testing is now a burning issue in semiconductor technology. Conventional IC tester, Automatic Test Equipment (ATE), cannot cope with the today’s continuously increasing complexities in IC technology. Deterministic algorithm, which is an idea of 1960’s, is adopted in the ATE. Recently pseudo-random testing approach of IC testing has been emerged as an economically viable alternative … …American Journal of Applied Sciences, Vol. 2, Issue 4 · 30 Apr 2005 · 7,063 accessesView PDF Cite