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Research ArticleOpen accessIn the abstractResidual Defects in Silicon Implanted with Boron and Phosphorous IonsM. JadanAccumulation of radiation defects in Si implanted with B+ or P+ ions, and formation of the residual extended defects (dislocation loops, rod-like defects) in the process of successive thermal treatment have been studied. The anomalies observed in the formation of the extended defects are associated with the elastic stresses in the damaged regions affecting the process of radiation defects clustering. …American Journal of Applied Sciences, Vol. 2, Issue 4 · 30 Apr 2005 · 6,931 accessesView PDFCite
Research ArticleOpen accessIn the abstractDepth Estimation of 2-D Magnetic Anomalous Sources by Using Euler Deconvolution MethodM. G.E. Dawi, Liu Tianyou, Shi Hui, Luo DapengEuler deconvolution method is the method of depth estimation which is best suited for anomalies caused by isolating and multiple anomalous sources. In the present study, algorithmic programs based on generalizing linear inverse theory, uses a least square sense to solve for Euler’s equation is being written. The Euler technique that can estimate the location of a simple body from … …American Journal of Applied Sciences, Vol. 1, Issue 3 · 30 Sep 2004 · 7,459 accessesView PDFCite