Research ArticleOpen accessIn the abstractDesign of a LOW Cost IC TesterLiakot Ali, Roslina Sidek, Ishak Aris et al.Low cost Integrated Circuit (IC) testing is now a burning issue in semiconductor technology. Conventional IC tester, Automatic Test Equipment (ATE), cannot cope with the today’s continuously increasing complexities in IC technology. Deterministic algorithm, which is an idea of 1960’s, is adopted in the ATE. Recently pseudo-random testing approach of IC testing has been emerged as an economically viable alternative … …American Journal of Applied Sciences, Vol. 2, Issue 4 · 30 Apr 2005 · 7,063 accessesView PDFCite
Research ArticleOpen accessIn the abstractDesign of a Current Sensor for IDDQ Testing of CMOS ICMohd Liakot Ali, Nurul Huda KhamisThis study presents the design of an off-chip current sensor for IDDQ testing of CMOS (Complementary Metal-oxide Semiconductor) ICs (integrated circuit). It provides a linear voltage signal of IDDQ current with a conversion factor of 5 mV/μA without any amplification. A voltage-controlled switch is used to bypass the transient current peaks. It has also been shown that the sensor is … …American Journal of Applied Sciences, Vol. 2, Issue 3 · 31 Mar 2005 · 6,834 accessesView PDFCite