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Journal of Computer Science

ISSN 1549-3636 (print)eISSN 1552-6607 (online) Open access
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Research Article · Open access · Published 13 March 2012

Low Transition-Generalized Linear Feedback Shift Register Based Test Pattern Generator Architecture for Built-in-Self-Test

P. Sakthivel, A. Nirmal Kumar
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Citing articles (4)

Read from Crossref’s cited-by service every week, newest first.

  1. doi:10.3390/jlpea15030047Found 17 August 2025
  2. doi:10.1109/netact.2017.8076788Found 12 June 2020
  3. doi:10.1049/el.2015.3940Found 12 June 2020
  4. doi:10.1142/s0218126618500780Found 12 June 2020