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American Journal of Applied Sciences

ISSN 1546-9239 (print)eISSN 1554-3641 (online) Open access
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Research Article · Open access · Published 28 May 2014

FAULT AND RELIABILITY ANALYSIS OF CARBON NANO TUBE FET SRAM IN THE PRESENCE OF SINGLE EVENT UPSET

T. R. Rajalakshmi, R. Sudhakar
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