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American Journal of Applied Sciences

ISSN 1546-9239 (print)eISSN 1554-3641 (online) Open access
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Research Article · Open access · Published 21 July 2012

Low Transition Test Pattern Generator Architecture for Built-in-Self-Test

P. Sakthivel, A. NirmalKumar, T. Mayilsamy
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Citing articles (4)

Read from Crossref’s cited-by service every week, newest first.

  1. doi:10.1007/978-3-031-31164-2_1Found 2 May 2023
  2. doi:10.1007/s10836-018-5756-3Found 12 June 2020
  3. doi:10.1109/netact.2017.8076788Found 12 June 2020
  4. doi:10.1049/el.2015.3940Found 12 June 2020