Sign inSubmit
Research Article · Open access · Published 1 August 2011

Study the Characteristic of P-Type Junction-Less Side Gate Silicon Nanowire Transistor Fabricated by Atomic Force Microscopy Lithography

Arash Dehzangi, Farhad Larki, E.B. Saion et al.
ArticleArticle metrics

Since publication

8,635Views
5,377PDF downloads
9Citations (Crossref)

Views and downloads by month

NovDecJanFebMarAprMayJunJulAugSepOct
Views PDF downloadsLast 12 months, counted as COUNTER asks (robots and repeat clicks within 30 seconds left out)
Show as a table
Views and downloads by month
MonthViewsDownloads
Nov 2025148101
Dec 202514378
Jan 202616298
Feb 202613070
Mar 2026214110
Apr 2026135148
May 202617392
Jun 202620291
Jul 202619696
Aug 202611188
Sep 202612683
Oct 202611196

Citing articles (9)

Read from Crossref’s cited-by service every week, newest first.

  1. doi:10.1109/nano63165.2025.11113741Found 15 August 2025
  2. doi:10.1002/9781394248506.ch8Found 16 March 2025
  3. doi:10.1007/s12633-017-9606-1Found 12 June 2020
  4. doi:10.1109/rsm.2011.6088302Found 12 June 2020
  5. doi:10.4028/www.scientific.net/nh.3.93Found 12 June 2020
  6. doi:10.4028/www.scientific.net/nh.4.33Found 12 June 2020
  7. doi:10.1186/1556-276x-7-381Found 12 June 2020
  8. doi:10.1049/mnl.2012.0590Found 12 June 2020
  9. doi:10.3762/bjnano.3.91Found 12 June 2020