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American Journal of Applied Sciences

ISSN 1546-9239 (print)eISSN 1554-3641 (online) Open access
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Research Article · Open access · Published 30 April 2010

Evaluating the Maintenance Performance of the Semiconductor Factories Based on the Analytical Hierarchy Process and Grey Relational Analysis

Fei-Long Chen, Yun-Chin Chen
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Citing articles (4)

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  1. doi:10.3846/20294913.2013.876689Found 12 June 2020
  2. doi:10.3390/su9040493Found 12 June 2020
  3. doi:10.1108/gs-08-2016-0023Found 12 June 2020
  4. doi:10.7603/s40690-014-0004-2Found 12 June 2020