Sign inSubmit
ArticleMetrics
Research Article · Free to read · Published 31 May 2008

A Novel Fault Tolerant Reversible Gate For Nanotechnology Based Systems

Majid Haghparast & Keivan Navi

American Journal of Applied Sciences, Volume 5, Issue 5, pp. 519–523 · doi.org/10.3844/ajassp.2008.519.523

7,904 accesses5,419 downloads53 citations (Crossref)Metrics
Cite Check for updates

Abstract

This paper proposes a novel reversible logic gate, NFT. It is a parity preserving reversible logic gate, that is, the parity of the outputs matches that of the inputs. We demonstrate that the NFT gate can implement all Boolean functions. It renders a wide class of circuit faults readily detectable at the circuit's outputs. The proposed parity preserving reversible gate, allows any fault that affects no more than a single signal to be detectable at the circuit's primary outputs. The NFT gate can be used to make fault tolerant reversible logic circuits. We demonstrate how the well-known, and very useful, Toffoli gate can be synthesized from only two parity-preserving reversible gates. We show that our proposed parity-preserving Toffoli gate is much better in terms of number of reversible gates, number of garbage outputs and hardware complexity with compared to the existing counterpart.

Licence and reuse

Free to read. This article carries the publisher’s copyright, as printed on it: © 2008 Science Publications. It is free to read; ask us before reusing it.

How to reuse this article

Responses (0)

Have a comment on this research? Sign in to respond. Responses are moderated and published with your name and affiliation; the authors are invited to reply. How we use your dataWrite a response

About this article

Cite this article

Haghparast, M. & Navi, K. (2008). A Novel Fault Tolerant Reversible Gate For Nanotechnology Based Systems. American Journal of Applied Sciences, 5(5), 519–523. https://doi.org/10.3844/ajassp.2008.519.523

Licence
© Science Publications
Issue
Volume 5, Issue 5
Policies
Editorial independenceUse of generative AIData availabilityAppeals and complaints
Version
Version of record
A Novel Fault Tolerant Reversible Gate For Nanotechnology Based SystemsAmerican Journal of Applied Sciences · Volume 5, Issue 5 · pp. 519–523 · © Science PublicationsDownload