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American Journal of Applied Sciences

ISSN 1546-9239 (print)eISSN 1554-3641 (online) Open access
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Research Article · Open access · Published 31 May 2006

Mixed Mode EMI Noise Level Measurement in SMPS

R. Dhanasekaran, M. Rajaram, S. N. Sivanandam
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Citing articles (2)

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  1. doi:10.1109/icpe.2011.5944576Found 12 June 2020
  2. doi:10.1109/telfor.2012.6419398Found 12 June 2020