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American Journal of Applied Sciences

ISSN 1546-9239 (print)eISSN 1554-3641 (online) Open access
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Research Article · Open access · Published 30 April 2005

Design of a LOW Cost IC Tester

Liakot Ali, Roslina Sidek, Ishak Aris et al.
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Citing articles (3)

Read from Crossref’s cited-by service every week, newest first.

  1. doi:10.1063/5.0294750Found 1 November 2025
  2. doi:10.1109/iceeccot43722.2018.9001588Found 12 June 2020
  3. doi:10.1109/idt.2009.5404091Found 12 June 2020