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Author

Chee Fuei Pien

1 article in our journals

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Research ArticleOpen accessEffects of Total Ionizing Dose on Bipolar Junction TransistorChee Fuei Pien, Haider F. Abdul Amir, Saafie Salleh, Azali MuhammadProblem statement: The amount of ionizing radiation that Bipolar Junction Transistor (BJT) devices encounter during their lifecycle degrades both of their functional and electrical parameter performances. The different radiation environments either in space, high energy physics experiments, nuclear environment or fabrication process as well as for standard terrestrial operation possess an impact on the devices. Approach: In this research, analytical … …American Journal of Applied Sciences, Vol. 7, Issue 6 · 30 Jun 2010 · 8,311 accessesView PDFCite