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Research ArticleOpen accessIn the keywordsFault Detection and Classification in Power Electronic Circuits Using Wavelet Transform and Neural NetworkVenugopal Prasannamoorthy, Nanjundappan DevarajanProblem statement: The identification of faults in any analog circuit is highly required to ensure the reliability of the circuit. Early detection of faults in a circuit can greatly assist in maintenance of the system by avoiding possibly harmful damage borne out of the fault. Approach: A novel method for establishing a fault dictionary using Wavelet transform is presented. The … …Journal of Computer Science, Vol. 7, Issue 1 · 15 Jan 2011 · 8,415 accessesView PDF Cite

1 article for “Simulation-After-Test (SAT)”