4 articles for “Combinational circuits”

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Research ArticleOpen accessPhrase in the titleUsing Combinational Circuits for Control PurposesMaher A. Nabulsi, Mohammed A.F. Al-HusainyProblem statement: Combinational circuits are used in computers for generating binary control decisions and for providing digital components for data processing. Approach: The use of combinational circuits and logic gates to control other circuits was discussed. Different systems that use logic gates, multiplexers, decoders and encoders to control different circuits were presented. This study presented a design and implementation of … …Journal of Computer Science, Vol. 5, Issue 7 · 31 Jul 2009 · 7,237 accessesView PDF Cite

Research ArticleOpen accessIn the keywordsSingle Stuck-At Fault Diagnosing Circuit of Reed-Muller Canonical Exclusive-Or Sum of Product Boolean ExpressionsP. N. Neelakantan, A. E. JeyakumarA testable design with a universal test set for single stuck-at zero and stuck-at one faults of Reed-Muller canonical form of Exclusive-OR sum of product logic expressions is proposed. The test circuit detects almost all the single stuck-at faults and needs only simple modifications for variations in the circuit under test. The number of test vectors is also quite small … …Journal of Computer Science, Vol. 2, Issue 7 · 31 Jul 2006 · 6,587 accessesView PDF Cite

Research ArticleOpen accessIn the abstractBDD Path Length Minimization Based on Initial Variable OrderingP. W.C. Prasad, M. Raseen, A. Assi, S. M.N.A. SenanayakeA large variety of problems in digital system design, combinational optimization and verification can be formulated in terms of operations performed on Boolean functions. The time complexity of Binary Decision Diagram (BDD) representing a Boolean function is directly related to the path length of that BDD. In this paper we present a method to generate a BDD with minimum path … …Journal of Computer Science, Vol. 1, Issue 4 · 31 Dec 2005 · 6,504 accessesView PDF Cite

Research ArticleOpen accessIn the abstractDesign of a LOW Cost IC TesterLiakot Ali, Roslina Sidek, Ishak Aris et al.Low cost Integrated Circuit (IC) testing is now a burning issue in semiconductor technology. Conventional IC tester, Automatic Test Equipment (ATE), cannot cope with the today’s continuously increasing complexities in IC technology. Deterministic algorithm, which is an idea of 1960’s, is adopted in the ATE. Recently pseudo-random testing approach of IC testing has been emerged as an economically viable alternative … …American Journal of Applied Sciences, Vol. 2, Issue 4 · 30 Apr 2005 · 7,063 accessesView PDF Cite