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48 results for “Semiconductor”
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Research ArticleOpen accessIn the abstractStudy the Characteristic of P-Type Junction-Less Side Gate Silicon Nanowire Transistor Fabricated by Atomic Force Microscopy LithographyArash Dehzangi, Farhad Larki, E.B. Saion et al.Problem statement: Nanotransistor now is one of the most promising fields in nanoelectronic in order to less energy consuming and application to create developed programmable information processors. Most of Computing and communications companies invest hundreds of millions of dollars in research funds every year to develop smaller transistors. Approach: The Junction-less side gate silicon Nano-wire transistor has been fabricated by … …American Journal of Applied Sciences, Vol. 8, Issue 9 · 1 Aug 2011 · 8,635 accessesView PDFCite
Research ArticleOpen accessIn the abstractConstrained Response Surface Optimization for a Laser Beam Welding ProcessPongchanun LuangpaiboonProblem statement: On a current operating condition of a laser beam welding process in the hard disk drive industry, it has been found that shear strength of the head support and suspension assembly is slightly higher than customers' specification. This situation leads to an inspection with a large sample size and a high frequency. Shear strength is not only one … …Journal of Mathematics and Statistics, Vol. 7, Issue 1 · 29 Jan 2011 · 7,368 accessesView PDFCite
Research ArticleOpen accessIn the abstractA New Approach in Design and Operating Principle of Silicone Tactile SensorBakri Ali, Rozaini Othman, Rasdi Deraman, Muhammad Azmi AyubProblem statement: Research and development in tactile sensor are escalating due to the fact that advanced robot needs to interact with surrounding environments which is very complex, dynamic, uncontrolled and difficult to perceive reliably. Recent research has been focusing in development of new tactile sensor that takes advantage of advances in materials, Micro-Electromechanical Systems (MEMS) and semiconductor technology. To date, … …Journal of Computer Science, Vol. 6, Issue 8 · 31 Aug 2010 · 7,347 accessesView PDFCite
Research ArticleOpen accessIn the abstractMicroelectrical Mechanical Systems Switch for Designing Multi-Band AntennaA.H.M. Zahirul Alam, Md. Rafiqul Islam, Sheroz Khan, Muhammad Mahbubur RashidProblem statement: In this study Microelectrical Mechanical System (MEMS) switches were proposed to design a reconfigurable/multi-band antenna to replaced PIN diode switches or semiconductor switches due to lower insertion losses, good isolation, much lower intermodulation distortion, and lower power consumption. The antenna is able to operate at very high frequencies. Approach: A reconfigurable antenna that is capable to operate at … …Journal of Computer Science, Vol. 5, Issue 7 · 31 Jul 2009 · 6,687 accessesView PDFCite
Research ArticleOpen accessIn the abstractIterative Numerical Method of Gate Turn-Off Thyristor: Comparative Study Between Si and SiCS. M. Zahim, M. Norainon, J. M. Shawal, R. I.R.M. TaufikaProblem statement: Silicon (Si) has long been the dominant semiconductor of choice for high-power, high-temperature and high-frequency device applications. However, recently, wide bandgap semiconductors, particularly Silicon Carbide (SiC) has attracted because it offers tremendous benefits over other semiconductor materials in a large number of industrial and military. A change of technology from Si to SiC will revolutionize the power electronics … …American Journal of Engineering and Applied Sciences, Vol. 2, Issue 2 · 30 Jun 2009 · 8,123 accessesView PDFCite
Research ArticleOpen accessIn the abstractVerifying Complex Interaction between Hardware ProcessesKiran Ramineni, Shireesh Verma, Ian G. HarrisProblem statement: Verification of correct functionality of semiconductor devices has been a challenging problem. Given the device fabrication cost, it is critical to verify the expected functionality using simulations of executable device models before a device manufactured. However, typical industrial scale devices today involve large number of interactions between their components. Complexity of verifying all interactions becomes almost intractable even … …Journal of Computer Science, Vol. 5, Issue 2 · 28 Feb 2009 · 6,953 accessesView PDFCite
Research ArticleOpen accessIn the abstractWinner-Take-All Neural Network with Massively Optoelectronic InterconnectionsWissam H. Ali, Ahmed N. Abdalla, Wa'l H. AliThe increased interconnection density, bandwidth, nonlocality and fan-out-fan-in offered by optics over conventional electronic technologies make it a very attractive medium for a variety of application particularity in the field of communication system implementation for all types of computing engines is achieved. This is especially true for neural networks in which the demand for communication resources is extremely high. In … …American Journal of Applied Sciences, Vol. 6, Issue 2 · 28 Feb 2009 · 7,437 accessesView PDFCite
Research ArticleOpen accessIn the abstractPower Consumption and Performance’s Library on DSPs: Case Study MPEG2Jalel Ktari, Mohamed Abid, Nathalie Julien, Johann LaurentThe growing demand for portable electronic devices has led to an increased emphasis on power consumption within the semiconductor industry. As a result, designers are now encouraged to consider the impact of their decisions not only on speed and area, but also on power throughout the design space exploration. This article presents a high-level design space exploration methodology. It allows … …Journal of Computer Science, Vol. 3, Issue 3 · 31 Mar 2007 · 6,827 accessesView PDFCite
Research ArticleOpen accessIn the abstractSingle-Electron Transistor (SET) Process and Device Simulation Using SYSNOPSYS TCAD ToolsUda Hashim, Amiza RasmiSimulation of semiconductor device fabrication and operation is important to the design and manufacture of integrated circuits because it provides insights into complex phenomena that cannot obtained through experimentation or simple analytic models. Process and device simulation is commonly using for the design of new very large scale integration (VLSI) devices and processes. Simulation programs serves as exploratory tools in … …American Journal of Applied Sciences, Vol. 3, Issue 7 · 31 Jul 2006 · 7,418 accessesView PDFCite
Research ArticleOpen accessIn the abstractDesign of a LOW Cost IC TesterLiakot Ali, Roslina Sidek, Ishak Aris et al.Low cost Integrated Circuit (IC) testing is now a burning issue in semiconductor technology. Conventional IC tester, Automatic Test Equipment (ATE), cannot cope with the today’s continuously increasing complexities in IC technology. Deterministic algorithm, which is an idea of 1960’s, is adopted in the ATE. Recently pseudo-random testing approach of IC testing has been emerged as an economically viable alternative … …American Journal of Applied Sciences, Vol. 2, Issue 4 · 30 Apr 2005 · 7,063 accessesView PDFCite