Sign inSubmit
Tips: “quotes” for a phrase · author:Lee · a DOI goes straight to its article

26 articles for “capacitance”

Set a search alert
Research ArticleOpen accessIn the abstractMoisture Content Prediction of Dried Longan Aril from Dielectric Constant Using Multilayer Perceptrons and Support Vector RegressionSanong Amaroek, Nipon Theera-Umpon, Kittichai Wantanajittikul, Sansanee AuephanwiriyakulProblem statement: Estimation of moisture contents of dried food products from their dielectric constants was an important step in moisture measurement systems. The regression models that provide good prediction performance are desirable. Approach: The Multilayer Perceptrons (MLP) and Support Vector Regression (SVR) were applied in this research to predict the moisture contents of dried longan arils from their dielectric constants. … …American Journal of Applied Sciences, Vol. 7, Issue 10 · 31 Oct 2010 · 7,666 accessesView PDFCite
Research ArticleOpen accessIn the abstractElectric Power System Under-Voltage Load Shedding Protection Can Become a TrapLuiz Augusto Pereira Fernandes, Alexandre Rocco, Heraldo Silveira Barbuy, Geraldo Caixeta GuimarãesProblem statement: Under-Voltage Load Shedding (UVLS) protection of Electric Power Systems (EPS) is frequently used against Voltage Collapse (VC), however when there is automatic bus voltage regulation with excessive capacitive compensation, the UVLS scheme may not trip. In this case, load shedding must be based in a Voltage Collapse Proximity Indicator (VCPI). Many UVLS procedures may not be appropriate today. … …American Journal of Applied Sciences, Vol. 6, Issue 8 · 31 Aug 2009 · 7,203 accessesView PDFCite
Research ArticleOpen accessIn the abstractUsage of Lightning Arrester Line to Feed Light Electrical LoadsHani Bani Odeh, Yousif El-TousIn remote areas, light loads (tens of kilowatts) are scattered and situated in the field of high voltage lines (66KV and above). These loads are very far from the main feeders/sub-stations (33KV-0.380KV). Feeding such loads in the traditional ways like provision of Diesel-Powered Stations, installation of new distribution lines from the Feeding Centers, or building new Sub-Stations are not practical … …American Journal of Applied Sciences, Vol. 6, Issue 1 · 31 Jan 2009 · 8,228 accessesView PDFCite
Research ArticleOpen accessIn the abstractLow-g Area-changed MEMS Accelerometer Using Bulk Silicon TechniqueBadariah Bais, Burhanuddin Yeop MajlisA bulk micromachined accelerometer based on an area variation capacitive sensing for low-g applications was developed. The accelerometer was designed with ribbed-style fingers structure on the movable mass connected in parallel and suspended over stationary electrodes composed of differential comb fingers by means of suspension beams anchored onto the substrate. A folded, rigid truss suspension design with low spring constant … …American Journal of Applied Sciences, Vol. 5, Issue 6 · 30 Jun 2008 · 7,630 accessesView PDFCite
Research ArticleOpen accessIn the abstractAutomatic Calibration of Frequency Compensation System in Computer-Controlled Patch-Clamp AmplifierJun Xiong, Gang Hu, Anlian QuComputer-controlled patch-clamp amplifier is a digitally controlled analog device used to record the cellular ion channel currents in electrophysiology research. The inherent bandwidth and performance of the headstage is limited by the stray capacitance and distributed capacitance across the feedback resistors. In order to effectively improve the performance of the headstage, the paper advanced a simplified automatic calibration method of … …Journal of Computer Science, Vol. 3, Issue 10 · 31 Oct 2007 · 6,814 accessesView PDFCite
Research ArticleOpen accessIn the abstractSingle-Electron Transistor (SET) Process and Device Simulation Using SYSNOPSYS TCAD ToolsUda Hashim, Amiza RasmiSimulation of semiconductor device fabrication and operation is important to the design and manufacture of integrated circuits because it provides insights into complex phenomena that cannot obtained through experimentation or simple analytic models. Process and device simulation is commonly using for the design of new very large scale integration (VLSI) devices and processes. Simulation programs serves as exploratory tools in … …American Journal of Applied Sciences, Vol. 3, Issue 7 · 31 Jul 2006 · 7,418 accessesView PDFCite