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Research Article · Free to read · Published 31 May 2008

Estimation of C*-Integral in Thin T-Sections Subjected to Projection and Remote Loading Base on Elastic Stress Concentration Factor

A.R. Gowhari-Anaraki, F. Djavanroodi & S. Shadlou

American Journal of Applied Sciences, Volume 5, Issue 5, pp. 586–596 · doi.org/10.3844/ajassp.2008.586.596

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Abstract

The finite element method has been used to predict the creep rupture parameter, C*-Integral of flat T-section bar subjected to loaded projection and remote loading with a crack or crack-like flaw introduced in the fillet (i.e., high stress) region of the component. In this study, a new dimensionless creeping crack configuration factor, Q* has been introduced. Power low creeping finite element analyses have been performed and the results are presented in the form of Q* for a wide range of components and crack geometric parameters. These parameters are chosen to be representative of typical practical situations and have been determined from evidence presented in the open literature. The extensive range of Q* obtained from the analyses are then used to obtain equivalent prediction equations using a statistical multiple non-linear regression model. The predictive equations for Q*, which are based on the elastic stress concentration factor, can also be used easily to calculate the C*-Integral values for extensive range of geometric parameters. The C*-Integral values obtained from predictive equations were also compared with those obtained from Reference Stress Method (RSM). Finally, creep zone growth behavior was studied in the component during transient time.

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Gowhari-Anaraki, A., Djavanroodi, F. & Shadlou, S. (2008). Estimation of C*-Integral in Thin T-Sections Subjected to Projection and Remote Loading Base on Elastic Stress Concentration Factor . American Journal of Applied Sciences, 5(5), 586–596. https://doi.org/10.3844/ajassp.2008.586.596

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Estimation of C*-Integral in Thin T-Sections Subjected to Projection and Remote Loading Base on Elastic Stress Concentration FactorAmerican Journal of Applied Sciences · Volume 5, Issue 5 · pp. 586–596 · © Science PublicationsDownload